Наши публикации
- Comparative Study Between Monte-Carlo Tools for Space Applications
- Impact of Multiple Write Cycles on Radiation Sensitivity of NAND Flash Memory Devices
- Assessment of the direct ionization contribution to the proton SEU rate
- Total Ionizing Dose influence on the Single Event Effect sensitivity of active EEE components
- Part-to-part and lot-to-lot variability study of TID effects in bipolar linear devices
- TID Influence on the SEE sensitivity of Active EEE components
- Risk assessment of SEE events due to high energy electrons during the JUICE mission
- R &T Proton Direct Ionization
- Impact of the consideration of AE9/AP9 models on the space radiation environment specification
- Impact of the consideration of the LEO trapped proton anisotropy on dose calculation at component level
- Impact of the mission definition parameters on the space radiation environment specification
- OMERE space radiation environment and effects tool: new developments and new interface
- Heavy Ion SEE results on GR718A, MT29F16G08, Dual LVDS Transceiver
- Single Event Burnout testing of high power Schottky diodes
- TRADCARE: tool for SEE prediction in a radiation environment
- Comparison of TNID calculation methods- FASTRAD® 3.7
- Impact of the detector definition on the Reverse Monte Carlo calculation result – FASTRAD® 3.7
- Recoil atom flux calculation in electronic components by Monte Carlo method
P. Pourrouquet, A. Varotsou, L. Sarie, J-C. Thomas, N. Chatry, D. Standarovski, G. Rolland, and C. Barillot, RADECS 2016, Bremen, Germany
B. Vandevelde, N. Chatry, N. Sukhaseum, J. Guillermin, L. Gouyet, A. Rousset, R. Gaillard, D. Dangla and E. Lorfèvre, RADECS 2016, Bremen, Germany
J. Guillermin, N. Sukhaseum, A. Privat, P. Pourrouquet, T. Cardaire, N. Chatry, F. Bezerra and R. Ecoffet, RADECS 2016, Bremen, Germany
L. Salvy, A. Varotsou, A. Samaras, B. Vandevelde, L. Gouyet, A. Rousset, L. Azema, C. Sarrau, N. Chatry, and M. Poizat, RADECS 2016, Bremen, Germany
J. Guillermin, N. Sukhaseum, A. Varotsou, A. Privat, P. Garcia, M. Vaillé, J.C. Thomas, N. Chatry and C. Poivey, RADECS 2016, Bremen, Germany
Lionel Salvy, Radiation Test Workshop 2016, Sevilla, Spain
N. Sukhaseum, A. Varotsou, B. Vandevellde and C. Boatelllla-Pollo, ESA/CNES Presentation Days 2017, Noordwijk, The Netherlands
N. Sukhaseum, J. Guillermin, N. Chatry, F. Bezerra and R. Ecoffet, ESA/CNES Presentation Days 2017, Noordwijk, The Netherlands
J. Guillermin and A. Varotsou, TRAD, D. Standarovski and R. Ecoffet, CNES, ESA/CNES Presentation Days 2017, Noordwijk, The Netherlands
P. Pourrouquet, A. Varotsou and R. Fonta, TRAD, D. Boscher, ONERA/DESP, R. Ecoffet, CNES, ESA/CNES Presentation Days 2017, Noordwijk, The Netherlands
J. Guillermin and A. Varotsou, TRAD, R. Ecoffet and D. Standarovski, CNES, ESA/CNES Presentation Days 2017, Noordwijk, The Netherlands
A. Varotsou, T. Cardaire, P. Pourrouquet, J. Guillermin and R. Fonta, TRAD, R. Ecoffet, G. Rolland and D. Standarovski, CNES, ESA/CNES Presentation Days 2017, Noordwijk, The Netherlands
Presented by Pierre GARCIA, Enoal LE GOULVEN, Lionel SALVY, Benjamin RENAUD and Athina VAROTSOU with the support of Christian POIVEY
Thanks to the input from Pierre WANG, Fredrik STURESSON and Jan WOUTERS, ESA/CNES Presentation Days 2017, Noordwijk, The Netherlands
Thanks to the input from Pierre WANG, Fredrik STURESSON and Jan WOUTERS, ESA/CNES Presentation Days 2017, Noordwijk, The Netherlands
Presented by Pierre GARCIA, Enoal LE GOULVEN, Fabien WIDMER, Athina VAROTSOU with the support of Cesar BOATELLA-POLO, ESA/CNES Presentation Days 2017, Noordwijk, The Netherlands
N. Andrianjohany, P. Pourrouquet, N. Chatry, R. Ecoffet and D. Standarovski, ESA/CNES Presentation Days 2017, Noordwijk, The Netherlands
P. Pourrouquet, A. Varotsou and A. Privat (TRAD), D. Standarovski (CNES), ESA/CNES Presentation Days 2017, Noordwijk, The Netherlands
P. Pourrouquet, V. Traisnel, and A. Varotsou (TRAD), G. Rolland (CNES), ESA/CNES Presentation Days 2017, Noordwijk, The Netherlands
P. Pourrouquet, V. Traisnel and N. Chatry (TRAD), G. Rolland and R. Ecoffet (CNES), ESA/CNES Presentation Days 2017, Noordwijk, The Netherlands