Nos publications
- Analysis of Current Events Triggered by Heavy Ion Microbeam and Pulsed Laser on a MRAM
- Contribution of the proton direct ionization to the SEU rate for low-scale devices
- Electron induced SEU and MBU sensitivity of 20-nm planar and 16-nm FinFET SRAM-based FPGA
- Comparative Study Between Monte-Carlo Tools for Space Applications
- Impact of Multiple Write Cycles on Radiation Sensitivity of NAND Flash Memory Devices
- Assessment of the direct ionization contribution to the proton SEU rate
- Total Ionizing Dose influence on the Single Event Effect sensitivity of active EEE components
- Part-to-part and lot-to-lot variability study of TID effects in bipolar linear devices
- TID Influence on the SEE sensitivity of Active EEE components
- Risk assessment of SEE events due to high energy electrons during the JUICE mission
- R &T Proton Direct Ionization
- Impact of the consideration of AE9/AP9 models on the space radiation environment specification
- Impact of the consideration of the LEO trapped proton anisotropy on dose calculation at component level
- Impact of the mission definition parameters on the space radiation environment specification
- OMERE space radiation environment and effects tool: new developments and new interface
- Heavy Ion SEE results on GR718A, MT29F16G08, Dual LVDS Transceiver
- Single Event Burnout testing of high power Schottky diodes
- TRADCARE: tool for SEE prediction in a radiation environment
- Comparison of TNID calculation methods- FASTRAD® 3.7
- Impact of the detector definition on the Reverse Monte Carlo calculation result – FASTRAD® 3.7
- Recoil atom flux calculation in electronic components by Monte Carlo method