Electronic components testing

Electronic components testing is our historical activity. For more than 20 years, we have tested more than 5 000 references, across all technologies: from transistors to processors, from tpower MOSFETs to FPGAs and from optocouplers to microcontrollers.

We are equipped to test all effects types: TID, SEE (heavy ions, protons, neutrons), TNID, according to current ECSS and MIL-STD standards.

The whole “test” team has the dual electronic and radiation competence, which guarantees costs’ optimization and optimal service quality.

The cumulative dose – TID testing – can degrade the electrical and functional parameters of an electronic component, which can lead to its destruction. TRAD designs test benches to measure electrical drifts after different irradiation steps, and apply different dose rates depending on the tested technology.
The SEE tests are carried out under heavy ions, neutrons and protons. TRAD designs test benches to measure the occurrence rates of SEU (single event Upset MBU & MCU), SET (single event transient), SEL (Single Event Latch up), SEFI (Single Event Functional Interrupt) and other so-called “singular” effects.

For each test, TRAD provide a complete report which includes all input data – specifications, test plans, full test benches’ traceability: boards, measuring devices – and output data – test results, analysis (if requested) – allowing a rapid results exploitation.

In order to optimize measurement time and development efforts, TRAD owns an comprehensive range of automatic testers (ATM):

• Universal SZ testers
• µTest – MuTest Tester
• Diamond D10 Tester – Credence

And irradiation means:

• Californium source (Cf252)- VASCO
• Gamma radiation laboratory (Co60) – GAMRAY
• YAG pulsed laser